<?xml version="1.0" encoding="UTF-8"?>
<feed xmlns="http://www.w3.org/2005/Atom" xmlns:dc="http://purl.org/dc/elements/1.1/">
  <title>DSpace Collection:</title>
  <link rel="alternate" href="http://localhost:8080/xmlui/handle/123456789/2961" />
  <subtitle />
  <id>http://localhost:8080/xmlui/handle/123456789/2961</id>
  <updated>2026-06-23T06:32:33Z</updated>
  <dc:date>2026-06-23T06:32:33Z</dc:date>
  <entry>
    <title>A Novel Algorithm for Multi-label Classification by Exploring Feature and Label Dissimilarities</title>
    <link rel="alternate" href="http://localhost:8080/xmlui/handle/123456789/2962" />
    <author>
      <name>Tidake  V. S.</name>
    </author>
    <author>
      <name>Sane S. S.</name>
    </author>
    <id>http://localhost:8080/xmlui/handle/123456789/2962</id>
    <updated>2021-07-17T10:21:43Z</updated>
    <published>2019-07-04T00:00:00Z</published>
    <summary type="text">Title: A Novel Algorithm for Multi-label Classification by Exploring Feature and Label Dissimilarities
Authors: Tidake  V. S.; Sane S. S.
Abstract: Selection of appropriate nearest neighbors greatly&#xD;
affects predictive accuracy of nearest neighbor classifier.&#xD;
Feature similarity is often used to decide the set of k nearest&#xD;
neighbors. Predictive accuracy of multi-label kNN could further&#xD;
be enhanced if in addition to the feature similarity, difference in&#xD;
feature values and dissimilarity of the instance labels are also&#xD;
taken into account to decide the set of k nearest neighbors. This&#xD;
paper deals with an algorithm called “ML-FLD” that not only&#xD;
takes into account features similarity of the instances, but also&#xD;
considers feature difference and label dissimilarity in order to&#xD;
decide the k nearest neighbors of a given unseen instance for&#xD;
the prediction of its labels. The algorithm when tested using&#xD;
well-known datasets and checked with the existing well known&#xD;
algorithms, provides better performance in terms of example based metrics such as hamming loss, ranking loss, one error, coverage, average precision, accuracy, F measure as well as label-based metrics like macro-averaged and micro-averaged F measure.</summary>
    <dc:date>2019-07-04T00:00:00Z</dc:date>
  </entry>
</feed>

