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http://localhost:8080/xmlui/handle/123456789/2257| Title: | Comparative Study of Multiresolution Analysis and Distance Measures for Face Recognition |
| Authors: | . Kharate, G. K |
| Keywords: | distance measure, face recognition wavelet |
| Issue Date: | 1-Jun-2013 |
| Abstract: | In this paper we have compared 7 distance measures for face recognition using multi resolution analysis. Different wavelet families like Haar, Daubechies, Symlet, Biothogonal are used to test the results. Recognition experiments are performed using the database containing images of 400 persons. The experiments showed that the best recognition results are achieved using Manhattam distance measure on A2 and A3 subbands of symlets 8 wavelet. |
| URI: | http://192.168.3.232:8080/jspui/handle/123456789/2257 |
| Appears in Collections: | Electronics OR E & TC |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| MRA(1).pdf | 1.9 MB | Unknown | View/Open |
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